IEEE - Institute of Electrical and Electronics Engineers, Inc. - Error performance prediction of randomly shortened and punctured LDPC codes

Author(s): Adriaan Suls ; Yannick Lefevre ; Jeroen Van Hecke ; Mamoun Guenach ; Marc Moeneclaey
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (CD): 2373-7891
ISSN (Electronic): 1558-2558
ISSN (Paper): 1089-7798
DOI: 10.1109/LCOMM.2019.2900893
Regular:

In this contribution we show that the word error rate (WER) performance in the waterfall region of a randomly shortened and punctured low density parity check (LDPC) code can be accurately... View More

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