IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Behavioral Compact Model for Static Characteristics of 3D NAND Flash Memory

Author(s): Shubham Sahay ; Dmitri Strukov
Sponsor(s): IEEE Electron Devices Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1558-0563
ISSN (Paper): 0741-3106
DOI: 10.1109/LED.2019.2901211
Regular:

We present a behavioral compact model for static characteristics of 3D NAND flash memory for integrated circuits and system-level applications utilizing BSIM-CMG 110.0.0. This model is easy to... View More

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