IEEE - Institute of Electrical and Electronics Engineers, Inc. - Reliability-Aware 3D Clock Distribution Network Using Memristor Ratioed Logic

Author(s): Nahid Mirzaie ; Chung-Ching Lin ; Ahmed Alzahmi ; Gyung-Su Byun
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 2156-3985
ISSN (Paper): 2156-3950
DOI: 10.1109/TCPMT.2019.2900851
Regular:

A novel reliability-aware clock distribution network (CDN) in a three-dimensional (3D) I/O interface packaging integrating memristor ratioed logic (MRL) is presented. An evolutionary algorithm has... View More

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