IEEE - Institute of Electrical and Electronics Engineers, Inc. - An Implementation of Scalable High Throughput Data Platform for Logging Semiconductor Testing Results

Author(s): Chen-Kun Tsung ; Hsiang-Yi Hsieh ; Chao-Tung Yang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 2169-3536
DOI: 10.1109/ACCESS.2019.2901115
Regular:

Unlike graded data of common semiconductor test results storing in relational databases, log data in the standard test data format (STDF) contain millions of test data entries. In a semiconductor... View More

Advertisement