IEEE - Institute of Electrical and Electronics Engineers, Inc. - A machine learning approach for choosing component level conditions for prognostics of AMS systems

2018 International Symposium on Devices, Circuits and Systems (ISDCS)

Author(s): Sayandeep Sanyal ; Antara Ain ; Pallab Dasgupta
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2018
Conference Location: Howrah, India
Conference Date: 29 March 2018
Page(s): 1 - 6
ISBN (Electronic): 978-1-5386-5122-3
ISBN (USB): 978-1-5386-5121-6
DOI: 10.1109/ISDCS.2018.8379641
Regular:

Ageing of components is a predominant concern for the reliability of systems which are expected to be in use over a long period of time. Unlike digital circuits where ageing causes logical errors,... View More

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