IEEE - Institute of Electrical and Electronics Engineers, Inc. - Improving the Testing of Java Garbage Collection Through an Efficient Benchmark Generation

2018 6th International Conference in Software Engineering Research and Innovation (CONISOFT)

Author(s): A. Omar Portillo-Dominguez ; Vanessa Ayala-Rivera
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2018
Conference Location: San Luis Potosí, Mexico, Mexico
Conference Date: 24 October 2018
Page(s): 1 - 10
ISBN (Electronic): 978-1-5386-6577-0
DOI: 10.1109/CONISOFT.2018.8645889
Regular:

Garbage Collection (GC) is a core feature of multiple modern technologies (e.g., Java, Android). On one hand, it offers significant software engineering benefits over explicitly memory management,... View More

Advertisement