IEEE - Institute of Electrical and Electronics Engineers, Inc. - Superimposed Impulse Voltage Test for DC-Cables

2018 IEEE International Conference on High Voltage Engineering and Application (ICHVE)

Author(s): Andreas Vos
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2018
Conference Location: ATHENS, Greece, Greece
Conference Date: 10 September 2018
Page(s): 1 - 4
ISBN (Electronic): 978-1-5386-5086-8
ISSN (Electronic): 2474-3852
DOI: 10.1109/ICHVE.2018.8641981
Regular:

This paper describes the superimposed impulse voltage test, its test setup and the components in use. The advantages and disadvantages of using different coupling and measuring elements are shown.... View More

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