IEEE - Institute of Electrical and Electronics Engineers, Inc. - Measuring completeness as metadata quality metric in Europeana

2018 IEEE International Conference on Big Data (Big Data)

Author(s): Peter Kiraly ; Marco Buchler
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2018
Conference Location: Seattle, WA, USA, USA
Conference Date: 10 December 2018
Page(s): 2,711 - 2,720
ISBN (Electronic): 978-1-5386-5035-6
ISBN (USB): 978-1-5386-5034-9
DOI: 10.1109/BigData.2018.8622487
Regular:

Europeana, the European digital platform for cultural heritage, has a heterogeneous collection of metadata records ingested from more than 3200 data providers. The original nature and context of... View More

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