IEEE - Institute of Electrical and Electronics Engineers, Inc. - Focusing on the Big Picture: Insights into a Systems Approach to Deep Learning for Satellite Imagery

2018 IEEE International Conference on Big Data (Big Data)

Author(s): Ritwik Gupta ; Carson D. Sestili ; Javier A. Vazquez-Trejo ; Matthew E. Gaston
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2018
Conference Location: Seattle, WA, USA, USA
Conference Date: 10 December 2018
Page(s): 1,931 - 1,936
ISBN (Electronic): 978-1-5386-5035-6
ISBN (USB): 978-1-5386-5034-9
DOI: 10.1109/BigData.2018.8621941
Regular:

Deep learning tasks are often complicated and require a variety of components working together efficiently to perform well. Due to the often large scale of these tasks, there is a necessity to... View More

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