IEEE - Institute of Electrical and Electronics Engineers, Inc. - Effective Outlier Detection based on Bayesian Network and Proximity

2018 IEEE International Conference on Big Data (Big Data)

Author(s): Sha Lu ; Lin Liu ; Jiuyong Li ; Thuc Duy Le
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2018
Conference Location: Seattle, WA, USA, USA
Conference Date: 10 December 2018
Page(s): 134 - 139
ISBN (Electronic): 978-1-5386-5035-6
ISBN (USB): 978-1-5386-5034-9
DOI: 10.1109/BigData.2018.8622230
Regular:

Outliers are objects that are significantly different from the others in the same dataset. They often contain insightful information for understanding the data and the data generation process.... View More

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