IEEE - Institute of Electrical and Electronics Engineers, Inc. - Test Frequency Compaction for Fault Detection in Analog Circuits Using Sensitivity Analysis

2018 IEEE 13th Dallas Circuits and Systems Conference (DCAS)

Author(s): Ajaykumar Adha ; Mehrdad Nourani
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2018
Conference Location: Dallas, TX, USA, USA
Conference Date: 12 November 2018
Page(s): 1 - 4
ISBN (Electronic): 978-1-5386-9262-2
DOI: 10.1109/DCAS.2018.8620115
Regular:

In this paper, we present a methodology to test faults induced by large deviations in components in analog circuits through multi-frequency test based on sensitivity analysis. Final compaction of... View More

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