IEEE - Institute of Electrical and Electronics Engineers, Inc. - Safe AI for CPS (Invited Paper)

2018 IEEE International Test Conference (ITC)

Author(s): Nathan Fulton ; Andre Platzer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2018
Conference Location: Phoenix, AZ, USA, USA
Conference Date: 29 October 2018
Page(s): 1 - 7
ISBN (Electronic): 978-1-5386-8382-8
ISSN (Electronic): 2378-2250
DOI: 10.1109/TEST.2018.8624774
Regular:

Autonomous cyber-physical systems-such as self-driving cars and autonomous drones-often leverage artificial intelligence and machine learning algorithms to act well in open environments. Although... View More

Advertisement