IEEE - Institute of Electrical and Electronics Engineers, Inc. - Access-Time Minimization in the IEEE 1687 Network Using Broadcast and Hardware Parallelism

2018 IEEE International Test Conference (ITC)

Author(s): Zhanwei Zhong ; Guoliang Li ; Qinfu Yang ; Krishnendu Chakrabarty
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2018
Conference Location: Phoenix, AZ, USA, USA
Conference Date: 29 October 2018
Page(s): 1 - 10
ISBN (Electronic): 978-1-5386-8382-8
ISSN (Electronic): 2378-2250
DOI: 10.1109/TEST.2018.8624850
Regular:

The IEEE Std. 1687 facilitates flexible access to on-chip instruments through the JTAG test-access port. This flexibility enables the minimization of the overall access time (OAT), and a number of... View More

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