IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Stressed Eye Testing Module for Production Test of 30-Gbps NRZ Signal Interfaces

2018 IEEE International Test Conference (ITC)

Author(s): Kiyotaka Ichiyama ; Takashi Kusaka ; Masahiro Ishida
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2018
Conference Location: Phoenix, AZ, USA, USA
Conference Date: 29 October 2018
Page(s): 1 - 10
ISBN (Electronic): 978-1-5386-8382-8
ISSN (Electronic): 2378-2250
DOI: 10.1109/TEST.2018.8624841
Regular:

high-speed data transmissions with smallamplitude signals, since jitter and noise in the transmitted signal may cause bit errors at receiver side, stressed eye testing which tests receivers with a... View More

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