IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fast and accurate linearity test for DACs with various architectures using segmented models

2018 IEEE International Test Conference (ITC)

Author(s): Shravan K. Chaganti ; Abalhassan Sheikh ; Sumit Dubey ; Frank Ankapong ; Nitin Agarwal ; Degang Chen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2018
Conference Location: Phoenix, AZ, USA, USA
Conference Date: 29 October 2018
Page(s): 1 - 10
ISBN (Electronic): 978-1-5386-8382-8
ISSN (Electronic): 2378-2250
DOI: 10.1109/TEST.2018.8624753
Regular:

Production test of parametric specifications is a significant contributor to the overall cost of build for analog and mixed-signal products. Data converters (ADCs and DACs) in particular are... View More

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