IEEE - Institute of Electrical and Electronics Engineers, Inc. - EMFORCED: EM-based Fingerprinting Framework for Counterfeit Detection with Demonstration on Remarked and Cloned ICs

2018 IEEE International Test Conference (ITC)

Author(s): Andrew Stern ; Ulbert Botero ; Bicky Shakya ; Haoting Shen ; Domenic Forte ; Mark Tehranipoor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2018
Conference Location: Phoenix, AZ, USA, USA
Conference Date: 29 October 2018
Page(s): 1 - 9
ISBN (Electronic): 978-1-5386-8382-8
ISSN (Electronic): 2378-2250
DOI: 10.1109/TEST.2018.8624679
Regular:

Today's globalized electronics supply chain is prone to counterfeit chip proliferation. Existing techniques to detect counterfeit integrated circuits (ICs) are limited by relatively high cost,... View More

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