IEEE - Institute of Electrical and Electronics Engineers, Inc. - Production Tests Coverage Analysis in the Simulation Environment

2018 IEEE International Test Conference (ITC)

Author(s): Niveditha Manjunath ; Dieter Haerle ; Stephen Sabanal ; Herbert Eichinger ; Hermann Tauber ; Andreas Machne ; Christian Manthey ; Mikko Vaananen ; Radu Grosu ; Dejan Nickovic
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2018
Conference Location: Phoenix, AZ, USA, USA
Conference Date: 29 October 2018
Page(s): 1 - 7
ISBN (Electronic): 978-1-5386-8382-8
ISSN (Electronic): 2378-2250
DOI: 10.1109/TEST.2018.8624870
Regular:

In the semiconductor industry, field returns have a negative impact with large costs and potential loss of reputation. As a consequence, a good coverage of the production tests with respect to the... View More

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