IEEE - Institute of Electrical and Electronics Engineers, Inc. - An Effective Methodology for Automated Diagnosis of Functional Pattern Failures to Support Silicon Debug

2018 IEEE International Test Conference (ITC)

Author(s): Pallav Gupta
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2018
Conference Location: Phoenix, AZ, USA, USA
Conference Date: 29 October 2018
Page(s): 1 - 8
ISBN (Electronic): 978-1-5386-8382-8
ISSN (Electronic): 2378-2250
DOI: 10.1109/TEST.2018.8624881
Regular:

In this paper, we present an industrial-grade solution for automated diagnosis of functional pattern failures. Fault isolation (FI) and failure analysis (FA) are two critical silicon debug... View More

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