IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fault Tolerance for RRAM-Based Matrix Operations

2018 IEEE International Test Conference (ITC)

Author(s): Mengyun Liu ; Lixue Xia ; Yu Wang ; Krishnendu Chakrabarty
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2018
Conference Location: Phoenix, AZ, USA, USA
Conference Date: 29 October 2018
Page(s): 1 - 10
ISBN (Electronic): 978-1-5386-8382-8
ISSN (Electronic): 2378-2250
DOI: 10.1109/TEST.2018.8624687
Regular:

An RRAM-based computing system (RCS) provides an energy efficient hardware implementation of vector-matrix multiplication for machine-learning hardware. However, it is vulnerable to faults due to... View More

Advertisement