IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fine-Grained Adaptive Testing Based on Quality Prediction

2018 IEEE International Test Conference (ITC)

Author(s): Mengyun Liu ; Renjian Pan ; Fangming Ye ; Xin Li ; Krishnendu Chakrabarty ; Xinli Gu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2018
Conference Location: Phoenix, AZ, USA, USA
Conference Date: 29 October 2018
Page(s): 1 - 10
ISBN (Electronic): 978-1-5386-8382-8
ISSN (Electronic): 2378-2250
DOI: 10.1109/TEST.2018.8624891
Regular:

The ever-increasing complexity of integrated circuits inevitably leads to high test cost. Adaptive testing provides an effective solution for test-cost reduction; this testing framework selects... View More

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