IEEE - Institute of Electrical and Electronics Engineers, Inc. - Practical Key Tag Monitoring in RFID Systems

2018 IEEE/ACM 26th International Symposium on Quality of Service (IWQoS)

Author(s): Jihong Yu ; Wei Gong ; Jiangchuan Liu ; Lin Chen ; Fangxin Wang ; Haitian Pang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2018
Conference Location: Banff, AB, Canada, Canada
Conference Date: 4 June 2018
Page(s): 1 - 2
ISBN (Electronic): 978-1-5386-2542-2
DOI: 10.1109/IWQoS.2018.8624117
Regular:

With rapid development of radio frequency identification (RFID) technology, ever-increasing research effort has been dedicated to devising various RFID-enabled services. The key tag monitoring,... View More

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