IEEE - Institute of Electrical and Electronics Engineers, Inc. - Detecting Changes of Wheat Vegetative Growth and Their Response to Climate Change Over the North China Plain

Author(s): Zhengjia Liu ; Sisi Wang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2018
Volume: 11
Page(s): 4,630 - 4,636
ISSN (Electronic): 2151-1535
ISSN (Paper): 1939-1404
DOI: 10.1109/JSTARS.2018.2870329
Regular:

Wheat vegetative growth, defined as the stage from green-up date to heading date (STAGE), is a crucial phrase, which largely affects crop yield. Previous some studies mainly focused on site-based... View More

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