IEEE - Institute of Electrical and Electronics Engineers, Inc. - Towards Automatic Optical Inspection of Soldering Defects

2018 International Conference on Cyberworlds (CW)

Author(s): Wenting Dai ; Abdul Mujeeb ; Marius Erdt ; Alexei Sourin
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2018
Conference Location: Singapore, Singapore, Singapore
Conference Date: 3 October 2018
Page(s): 375 - 382
ISBN (Electronic): 978-1-5386-7315-7
DOI: 10.1109/CW.2018.00074
Regular:

This paper proposes a method for automatic image-based classification of solder joint defects in the context of Automatic Optical Inspection (AOI) of Printed Circuit Boards (PCBs). Machine... View More

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