IEEE - Institute of Electrical and Electronics Engineers, Inc. - Plagiarism in Low-Stakes Unproctored Internet Testing for Programming Aptitude

2018 IEEE Ninth International Conference on Technology for Education (T4E)

Author(s): Viraj Kumar ; Priya Nayak ; Rhythm Girdhar
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2018
Conference Location: Chennai, India, India
Conference Date: 10 December 2018
Page(s): 134 - 137
ISBN (Electronic): 978-1-7281-1143-8
DOI: 10.1109/T4E.2018.00036
Regular:

Unproctored Internet Testing (UIT) is a popular form of assessment due to its flexibility and low cost. Results from a UIT may be invalid if there is excessive cheating, but this risk can be... View More

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