IEEE - Institute of Electrical and Electronics Engineers, Inc. - Cold Cathode Based Microwave Devices for Current and Future Systems

2018 31st International Vacuum Nanoelectronics Conference (IVNC)

Author(s): D. R. Whaley ; C.M. Armstrong ; Christopher E. Holland ; C. A. Spindt ; Paul R. Schwoebel
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2018
Conference Location: Kyoto, Japan
Conference Date: 9 July 2018
Page(s): 1 - 2
ISBN (Electronic): 978-1-5386-5717-1
ISBN (USB): 978-1-5386-5716-4
ISBN (Paper): 978-1-5386-5715-7
ISSN (Electronic): 2380-6311
DOI: 10.1109/IVNC.2018.8520271
Regular:

We report ongoing efforts to achieve reliable field emitter (FE) cathode operation for high current electron beam generation in RF microwave devices. These efforts include testing of cold cathode... View More

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