IEEE - Institute of Electrical and Electronics Engineers, Inc. - An Approach of Single-Crystal Defect Detection Using X-Ray Orientation Instrument

Author(s): Shouping Guan ; Yuyong Wang ; Xiangming Chen
Sponsor(s): IEEE Instrumentation and Measurement Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 13
ISSN (Electronic): 1557-9662
ISSN (Paper): 0018-9456
DOI: 10.1109/TIM.2018.2884017
Regular:

An intelligent and rapid detection approach based on an X-ray orientation instrument is proposed to identify the single-crystal defects through online single and offline batch defection. This... View More

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