IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analysis of Potential-Induced Degradation in Soda-Lime Glass and Borosilicate-Glass Cu(In,Ga)Se2 Samples

Author(s): M. Carmen Alonso-Garcia ; Peter Hacke ; Stephen Glynn ; Christopher P. Muzzillo ; Lorelle M. Mansfield
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2019
Volume: 9
Page(s): 331 - 338
ISSN (Electronic): 2156-3403
ISSN (Paper): 2156-3381
DOI: 10.1109/JPHOTOV.2018.2882195
Regular:

Potential-induced degradation (PID) is investigated in small-size Cu(In,Ga)Se2 (CIGS) submodules of individual cells. Samples with conventional soda-lime glass (SLG) and low-alkaline... View More

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