IEEE - Institute of Electrical and Electronics Engineers, Inc. - Trace Ratio Criterion based Large Margin Subspace Learning for Feature Selection

Author(s): Hui Luo ; Jiqing Han
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 2169-3536
DOI: 10.1109/ACCESS.2018.2888924
Regular:

In this paper, we propose a novel feature selection model based on subspace learning with the use of a large margin principle. Firstly, we present a new margin metric described by a given instance... View More

Advertisement