IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Survey of Super-Resolution in Iris Biometrics with Evaluation of Dictionary-Learning

Author(s): Fernando Alonso-Fernandez ; Reuben A. Farrugia ; Josef Bigun ; Julian Fierrez ; Ester Gonzalez-Sosa
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 2169-3536
DOI: 10.1109/ACCESS.2018.2889395
Regular:

The lack of resolution has a negative impact on the performance of image-based biometrics. While many generic super-resolution methods have been proposed to restore low-resolution images, they... View More

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