IEEE - Institute of Electrical and Electronics Engineers, Inc. - The assessment and countermeasure of technological progress in mining enterprise

Innovation in Technology Management. The Key to Global Leadership. PICMET '97

Author(s): Mu Dong ; Du Zhiping
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Portland, OR, USA, USA
Conference Date: 31 July 1997
ISBN (Paper): 0-7803-3574-0
DOI: 10.1109/PICMET.1997.653340
Regular:

Summary form only given. This paper presents the method of dynamic data envelopment analysis (DDEA) for the vertical comparison of an enterprise or department. This method is different from the... View More

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