IEEE - Institute of Electrical and Electronics Engineers, Inc. - Multicycle Broadside and Skewed-Load Tests for Test Compaction

Author(s): Irith Pomeranz
Sponsor(s): IEEE Council on Electronic Design Automation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1937-4151
ISSN (Paper): 0278-0070
DOI: 10.1109/TCAD.2018.2887049
Regular:

This paper describes a test compaction procedure that combines the advantages of using multicycle tests for test compaction with the advantages of using both broadside and skewed-load tests for... View More

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