IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Standalone FPGA-test Platform with Bi-directional Ports Supported

2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT)

Author(s): Hao Deng ; Jian Wang ; Xinxuan Tao ; Jinmei Lai
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2018
Conference Location: Qingdao, China, China
Conference Date: 31 October 2018
Page(s): 1 - 3
ISBN (CD): 978-1-5386-4439-3
ISBN (Electronic): 978-1-5386-4441-6
ISBN (Paper): 978-1-5386-4440-9
DOI: 10.1109/ICSICT.2018.8565013
Regular:

This paper presents a design of a standalone FPGA-test platform based on MicroBlaze to configure a FPGA and then test it automatically by a command-data flow without users' interference. Since the... View More

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