IEEE - Institute of Electrical and Electronics Engineers, Inc. - Research on Design and Test Method of High Performance 6 Input LUT

2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT)

Author(s): Yufan Zhang ; Yunbing Pang ; Jiqing Xu ; Xinxuan Tao ; Jian Wang ; Meng Yang ; Jinmei Lai
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2018
Conference Location: Qingdao, China, China
Conference Date: 31 October 2018
Page(s): 1 - 3
ISBN (CD): 978-1-5386-4439-3
ISBN (Electronic): 978-1-5386-4441-6
ISBN (Paper): 978-1-5386-4440-9
DOI: 10.1109/ICSICT.2018.8564803
Regular:

FPGA devices are becoming more widely used in various industries due to their field-programmable features. Its basic unit in configurable logic block(CLB) is the look-up table(LUT), which takes... View More

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