IEEE - Institute of Electrical and Electronics Engineers, Inc. - Efficient Implementations of Multiple Bit Burst Error Correction for Memories

2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT)

Author(s): Jia-Qiang Li ; Li-Yi Xiao ; Jing Guo ; Xue-Bing Cao
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2018
Conference Location: Qingdao, China, China
Conference Date: 31 October 2018
Page(s): 1 - 3
ISBN (CD): 978-1-5386-4439-3
ISBN (Electronic): 978-1-5386-4441-6
ISBN (Paper): 978-1-5386-4440-9
DOI: 10.1109/ICSICT.2018.8565727
Regular:

Soft error induced by space radiation particles can cause serious threat for memories that are widely used in the electronic system of aerospace task. This can corrupt the stored data and cause... View More

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