IEEE - Institute of Electrical and Electronics Engineers, Inc. - Aging Impacts on SOC Timing in Advanced FinFET Technologies

2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT)

Author(s): Yongsheng Sun ; Canhui Zhan ; Yiwei Fu ; Zhenghao Gan ; Waisum Wong
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2018
Conference Location: Qingdao, China, China
Conference Date: 31 October 2018
Page(s): 1 - 3
ISBN (CD): 978-1-5386-4439-3
ISBN (Electronic): 978-1-5386-4441-6
ISBN (Paper): 978-1-5386-4440-9
DOI: 10.1109/ICSICT.2018.8565644
Regular:

SOC (System on Chip) timing closure meets challenges in advanced FinFet technologies with lower voltage and higher frequency. As a part of variation, aging is taking more attention. But capturing... View More

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