IEEE - Institute of Electrical and Electronics Engineers, Inc. - Efficient Statistical Analysis for Correlated Rare Failure Events

2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT)

Author(s): Jun Tao ; Zhengqi Gao ; Dian Zhou ; Xuan Zeng
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2018
Conference Location: Qingdao, China, China
Conference Date: 31 October 2018
Page(s): 1 - 4
ISBN (CD): 978-1-5386-4439-3
ISBN (Electronic): 978-1-5386-4441-6
ISBN (Paper): 978-1-5386-4440-9
DOI: 10.1109/ICSICT.2018.8565038
Regular:

To estimate the overall rare probability of correlated failure events for complex system containing a large number of replicated cells, we summarize two novel techniques in this paper. First,... View More

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