IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Low-Overhead Radiation Hardened Flip-Flop Design for Soft Error Detection

2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT)

Author(s): Jie Li ; Li-Yi Xiao ; Hong-Chen Li ; Chun-Hua Qi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2018
Conference Location: Qingdao, China, China
Conference Date: 31 October 2018
Page(s): 1 - 3
ISBN (CD): 978-1-5386-4439-3
ISBN (Electronic): 978-1-5386-4441-6
ISBN (Paper): 978-1-5386-4440-9
DOI: 10.1109/ICSICT.2018.8564927
Regular:

In this paper, a low overhead radiation hardened flip-flop is developed for detecting soft errors caused by SET and SEU or timing issues. Error detection is based on comparing the values stored in... View More

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