IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Multi-Class Classification System for Passive Millimeter-Wave Image

2018 International Conference on Microwave and Millimeter Wave Technology (ICMMT)

Author(s): Shujin Zhu ; Yuehua Li
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2018
Conference Location: Chengdu, China, China
Conference Date: 7 May 2018
Page(s): 1 - 3
ISBN (Electronic): 978-1-5386-2416-6
ISBN (USB): 978-1-5386-2415-9
DOI: 10.1109/ICMMT.2018.8563597
Regular:

Since passive millimeter wave (PMMW) imaging has a lot of advantages over optical and infa-red imaging, it has been widely applied in the areas regarding remote sensing, security check and... View More

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