IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Fast One-Pixel Wide Contour Detection Method for Shapes Contour Traversal in Binary Images

2018 International Conference on Smart Systems and Technologies (SST)

Author(s): Hrvoje Leventic ; Tomislav Keser ; Kresimir Vdovjak
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2018
Conference Location: Osijek, Croatia, Croatia
Conference Date: 10 October 2018
Page(s): 11 - 14
ISBN (Electronic): 978-1-5386-7189-4
ISBN (USB): 978-1-5386-7188-7
DOI: 10.1109/SST.2018.8564595
Regular:

Contour detection is an important step in contour based object analysis in 2D images. We present a novel method for contour detection optimized for contour traversal tasks in 2D images. The method... View More

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