IEEE - Institute of Electrical and Electronics Engineers, Inc. - Complete Test Suite for the CTCS-3 Target Speed Monitor Based on IECP Test Theory

2018 IEEE International Conference on Intelligent Transportation Systems (ITSC)

Author(s): Wei Zheng ; Zhuolin Hu ; Tao Tang ; Jidong Lv ; Wei Shangguan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2018
Conference Location: Maui, HI, USA, USA
Conference Date: 4 November 2018
Page(s): 3,364 - 3,369
ISBN (Electronic): 978-1-7281-0323-5
ISBN (USB): 978-1-7281-0322-8
ISBN (Paper): 978-1-7281-0321-1
ISSN (Electronic): 2153-0017
DOI: 10.1109/ITSC.2018.8569978
Regular:

The distance-to-go curve, which performs the safety critical functions of the Chinese Train Control System Level 3 (CTCS-3), is characterized by large input domain parameters and complex fault... View More

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