IEEE - Institute of Electrical and Electronics Engineers, Inc. - Test Suite Generation for CTCS-3 Train Control System Based On TAIO and Mutation Theory

2018 IEEE International Conference on Intelligent Transportation Systems (ITSC)

Author(s): Tuo Wang ; Jidong Lv ; Baiquan Wei ; Tao Tang ; Wei Shangguan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2018
Conference Location: Maui, HI, USA, USA
Conference Date: 4 November 2018
Page(s): 1,950 - 1,955
ISBN (Electronic): 978-1-7281-0323-5
ISBN (USB): 978-1-7281-0322-8
ISBN (Paper): 978-1-7281-0321-1
ISSN (Electronic): 2153-0017
DOI: 10.1109/ITSC.2018.8569768
Regular:

As a safety-critical system, the Chinese Train Control System Level 3 (CTCS-3) have complex fault modes. To generate test suite, which can cover all known faults, is very difficult. In this paper,... View More

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