IEEE - Institute of Electrical and Electronics Engineers, Inc. - Investigation on the Effectiveness of Current Supply Testing Methods in CMOS Operational Amplifiers

2018 15th International Multi-Conference on Systems, Signals & Devices (SSD)

Author(s): Badi Guibane ; Belgacem Hamdi ; Abdellatif Mtibaa
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2018
Conference Location: Yassmine Hammamet, Tunisia, Tunisia
Conference Date: 19 March 2018
Page(s): 1,041 - 1,044
ISBN (Electronic): 978-1-5386-5305-0
ISBN (USB): 978-1-5386-5304-3
ISSN (Electronic): 2474-0446
DOI: 10.1109/SSD.2018.8570527
Regular:

In this paper we evaluate the effectiveness of current monitoring techniques in detecting Bridge and open defects in CMOS operational amplifiers. We evaluate the detection capabilities by using... View More

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