IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Novel Characterization Technique to Extract High Voltage - High Current IV Characteristics of Power MOSFETs from Dynamic Measurements

2018 IEEE 6th Workshop on Wide Bandgap Power Devices and Applications (WiPDA)

Author(s): Cristino Salcines ; Aleksei Kruglov ; Ingmar Kallfass
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2018
Conference Location: Atlanta, GA, USA, USA
Conference Date: 31 October 2018
Page(s): 1 - 6
ISBN (Electronic): 978-1-5386-5909-0
ISBN (USB): 978-1-5386-5908-3
DOI: 10.1109/WiPDA.2018.8569160
Regular:

This paper presents a methodology to characterize the IV characteristics of power MOSFETs at high voltage and high current (HVHC) operation region. This technique enables the characterization of... View More

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