IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Comprehensive Informative Metric for Analyzing HPC System Status Using the LogSCAN Platform

2018 IEEE/ACM 8th Workshop on Fault Tolerance for HPC at eXtreme Scale (FTXS)

Author(s): Yawei Hui ; Byung Hoon Park ; Christian Engelmann
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2018
Conference Location: Dallas, TX, USA, USA
Conference Date: 16 November 2018
Page(s): 29 - 38
ISBN (Electronic): 978-1-7281-0222-1
DOI: 10.1109/FTXS.2018.00007
Regular:

Log processing by Spark and Cassandra-based ANalytics (LogSCAN) is a newly developed analytical platform that provides flexible and scalable data gathering, transformation and computation. One... View More

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