IEEE - Institute of Electrical and Electronics Engineers, Inc. - Testing the Information Risk Level with ECU@Risk

2018 International Conference on Information Systems and Computer Science (INCISCOS)

Author(s): Esteban Crespo ; Jorge Bermeo
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2018
Conference Location: Quito, Ecuador, Ecuador
Conference Date: 13 November 2018
Page(s): 343 - 350
ISBN (Electronic): 978-1-5386-7612-7
DOI: 10.1109/INCISCOS.2018.00056
Regular:

Information is the most valuable element for any organization or person in this new century, being an instrument to create competitive advantage. However, despite the lack of knowledge on... View More

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