IEEE - Institute of Electrical and Electronics Engineers, Inc. - An Algebraic Binary Decision Diagram for Analysis of Dynamic Fault Tree

2018 5th International Conference on Dependable Systems and Their Applications (DSA)

Author(s): Wei Jiang ; Siwei Zhou ; Luyao Ye ; Dongdong Zhao ; Jing Tian ; W. Eric Wong ; Jianwen Xiang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2018
Conference Location: Dalian, China, China
Conference Date: 22 September 2018
Page(s): 44 - 51
ISBN (Electronic): 978-1-5386-9266-0
DOI: 10.1109/DSA.2018.00018
Regular:

Dynamic fault tree (DFT) is an extension of traditional static fault tree, in which several dynamic gates are introduced to model sequential dependency between fault events. As for the... View More

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