IEEE - Institute of Electrical and Electronics Engineers, Inc. - MCDC-Star: A White-Box Based Automated Test Generation for High MC/DC Coverage

2018 5th International Conference on Dependable Systems and Their Applications (DSA)

Author(s): Linghuan Hu ; W. Eric Wong ; D. Richard Kuhn ; Raghu Kacker
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2018
Conference Location: Dalian, China, China
Conference Date: 22 September 2018
Page(s): 102 - 112
ISBN (Electronic): 978-1-5386-9266-0
DOI: 10.1109/DSA.2018.00027
Regular:

The US Federal Aviation Administration requires complete modified condition/decision coverage (MC/DC) for the most critical (level A) software. Complete MC/DC is a gold standard for thoroughness... View More

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