IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Theoretical Analysis on the Impacts of Misestimated Test Cases

2018 5th International Conference on Dependable Systems and Their Applications (DSA)

Author(s): Yanhong Xu ; Beibei Yin ; Xiaohui Wan ; Chenglong Li ; Zheng Zheng
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2018
Conference Location: Dalian, China, China
Conference Date: 22 September 2018
Page(s): 113 - 118
ISBN (Electronic): 978-1-5386-9266-0
DOI: 10.1109/DSA.2018.00028
Regular:

The outcomes of test play an important role in fault localization. Due to the oracle problem, there are a large number of test cases unlabelled in testing. They can not be used directly and it... View More

Advertisement