IEEE - Institute of Electrical and Electronics Engineers, Inc. - [Regular Paper] Detection of Errors in Multi-genome Alignments Using Machine Learning Approaches

2018 IEEE 18th International Conference on Bioinformatics and Bioengineering (BIBE)

Author(s): Jaspal Singh ; Ramchalam Kinattinkara Ramakrishnan ; Mathieu Blanchette
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2018
Conference Location: Taichung, Taiwan, Taiwan
Conference Date: 29 October 2018
Page(s): 47 - 53
ISBN (Electronic): 978-1-5386-6217-5
ISSN (Electronic): 2471-7819
DOI: 10.1109/BIBE.2018.00017
Regular:

Whole-genome multiple alignments are widely used in genomics and evolution, and yet their accuracy is imperfect, due in part to the computational complexity of the task at hand. Identifying... View More

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