IEEE - Institute of Electrical and Electronics Engineers, Inc. - Clock-Skew-Aware Scan Chain Grouping for Mitigating Shift Timing Failures in Low-Power Scan Testing

2018 IEEE 27th Asian Test Symposium (ATS)

Author(s): Yucong Zhang ; Xiaoqin Wen ; Stefan Holst ; Kohei Miyase ; Seiji Kajihara ; Hans-Joachim Wunderlich ; Jun Qian
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2018
Conference Location: Hefei, China, China
Conference Date: 15 October 2018
Page(s): 149 - 154
ISBN (Electronic): 978-1-5386-9466-4
ISSN (Electronic): 2377-5386
DOI: 10.1109/ATS.2018.00037
Regular:

High scan shift power often leads to excessive heat as well as shift timing failures. Partial shift (shifting a subset of scan chains at a time) is a widely adopted approach for avoiding excessive... View More

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